Multifunctional Magneto - Optical Kerr Imaging System
This system enables real - time visualization of magnetization states and magnetic domain evolution in materials and spintronic devices with high spatial precision.
Wafer-Level Kerr Effect Measurement Instrument
This system uses polar MOKE to non - destructively analyze magnetic properties of wafer stacks before and after patterning with full - field measurement capability.
Surface Magneto - Optic Kerr Effect System
This system captures polar, longitudinal, and transverse Kerr signals for surface magnetization analysis, including hysteresis, coercivity, and saturation fields.
Micro Kerr Effect Magnetic Measurement System
This micro MOKE system enables non - contact magnetic hysteresis measurement on small areas, providing precise coercivity, remanence, and saturation field values.
Research - Grade MOKE Hysteresis Loop Tester
This research - grade MOKE system measures in - plane and out - of - plane hysteresis loops simultaneously, ideal for high - precision analysis of magnetic materials.