CMT-64 Silicon Diode Cryogenic Thermometer
CMT-64 silicon diode thermometer delivers accurate cryogenic temperature readings with high repeatability and excellent V-T curve consistency.
CMT-100 Platinum Resistance Cryogenic Thermometer
Accurate platinum resistance thermometer for 20K–500K cryogenic temperature monitoring. Fast response, compact size, and magnetic field tolerance.
Standard Cryogenic Probe Station
Precision cryogenic probe station for electrical and magnetic testing of semiconductors, spintronics, and micro-nano devices in low-temperature settings.
Wafer-Level In-Plane Magnetic Field Probe Station
Automated wafer-level probe station with in-plane magnetic field control, ±1% field uniformity, real-time feedback, and 0.02 mT resolution.
3D Magnetic Field Cryogenic Probe Station
Versatile cryogenic probe station enabling multi-axis magnetic field control and low-temperature testing. Ideal for semiconductors, MEMS, and superconducting materials.
2D Magnetic Field Cryogenic Probe Station
Dual-axis cryogenic probe station delivering vertical and in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Ideal for semiconductor testing.
1D In-Plane Magnetic Field Probe Station
High-precision cryogenic probe station delivering stable 1D in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Suitable for material testing.
Wafer-Level Vertical Magnetic Field Probe Station
High-precision wafer-level probe station with vertical magnetic field, ±1% field uniformity, and 0.02 mT resolution. Designed for cryogenic material testing.
1D Vertical Magnetic Field Probe Station
Cryogenic probe station delivering a uniform 1D vertical magnetic field (±1%@⌀2 mm) with high-resolution field monitoring (0.02 mT).
Universal Magnetic Field Probe Station
High-precision probe station for testing magnetic and electrical properties of semiconductors and spintronic devices under in-plane magnetic fields up to 330 mT.