CMT-70 Hall Effect Measurement System
Precision system for measuring carrier mobility, resistivity, and Hall coefficient in semiconductor research and material analysis.
CMT-100 High-Precision Hall Effect Measurement System
CMT-100 offers accurate Hall effect measurement with advanced components for analyzing semiconductor materials.
CMT-30 Permanent Magnet Hall Effect Measurement Meter
CMT-30 provides accurate Hall effect measurements using a permanent magnet setup, ideal for basic magnetic field testing and sensor evaluation.
CMT-50 Standard Hall Effect Measurement System
CMT-50 enables accurate Hall effect and resistivity analysis for semiconductor research, offering stable performance and reliable measurement results.
CMT-60 Compact Hall Effect Measurement Instrument
CMT-60 provides precise Hall effect and carrier mobility testing in a compact form, ideal for benchtop use in research and development labs.
CMT-3000 Hall Effect Characterization Device
CMT-3000 is an automated system integrating Hall effect, magnetoresistance, and I-V curve testing for advanced semiconductor material characterization.
CMT-1000T Dual-Temperature Hall Effect Test System
CMT-1000T enables Hall effect testing across high and low temperatures, integrating magnet, Gauss meter, Dewar, and precise temperature control.
CMT-1000H High-Temp Hall Effect Measurement System
CMT-1000H is designed for Hall effect analysis at high temperatures, integrating a vacuum chamber, Gauss meter, temperature control, and magnet system.
CMT-1000L Low-Temp Hall Effect Test System
CMT-1000L enables low-temperature Hall effect testing with integrated Dewar, magnet, and precision electronics for cryogenic carrier mobility analysis.
Automated Hall Effect Measurement System
This automated Hall effect system measures carrier concentration, mobility, resistivity, and Hall coefficient with micro-probe precision and HDTV microscopy.